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| ValueTest wafer consumption is a direct function of the process control and quality monitoring requirements at critical fabrication process steps. Overall test wafer usage may exceed the total output of production wafers, however, the usage ratio of test to production wafers may be reduced by up to one half through well established process controls and metrology. Furthermore, the cost of monitor wafers can be reduced by up to 70% by matching the test wafer restoration process to the monitor requirements. Full Reclaim - For High Quality Test and Monitor Wafers By convention, a fully restored test wafer may have up to 25 microns of thickness removed to eliminate implant impurity doping, films and surface damage. It then receives a surface polish, a number of cleaning steps, and a laser scan to verify surface particle counts are less than some predetermined limit. This procedure produces a high quality wafer suitable for use at almost all process monitoring steps and is the standard requirement for all restored process monitor wafers at many semiconductor companies. Recycle/Mechanical Test Wafers - For Equipment Checks, Baffle and Dummies.
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